Wafer Tester, Monitoring Defects and Contamination in the Bulk Region of Si Wafer
Delivery term:The date of payment from buyers deliver within days-
Price:
Negotiable
- minimum:
- Total supply:
-
Delivery term:
The date of payment from buyers deliver within days
-
seat:
Beijing
-
Validity to:
Long-term effective
-
Last update:
2017-08-06 15:36
-
Browse the number:
71
+
Shenzhen Gospell Smarthome Electronic Co. Ltd
- Contactaixin:
Contactaixin:
gbsa(Ms.)
-
telephone:
-
Area:
Beijing
Address:F518, Xinye Road, Building F10-12, Idea Land, Bao'an District, Shenzhen, Guangdong, China (518102)
- Website:
+
Model Number: KP - A65
Key Specifications/Special Features:
Special features:Monitoring defects and contamination in the bulk region of Si waferKey specifications:Impurities due to heavy metal contaminationCan detect Co, Ni, Ti, Mo, W, Pt, Au and PdCan detect but not identify them uniquelyCan detect and identify Cu and CrIron concentration determination both in CZ and FZ wafersRequires surface passivation: thermal oxide, chemical passivation or corona charging
Can be combined with the SPV, VQ and JPV
Integrated FOUP and mini environment
Main Export Markets:
- Asia
